Trooper BI Wafer Level Burn In Handler (WLBI)
Model : Trooper Bi Highlights
•Designed to be efficient and effective in its performance while taking up minimal space
•Multiple test parallelism with precision thermal chuck up to 200 200°C
•Optical alignment before probe
•Probe mark inspection capability
•User definable burn in profile
•Support pre burn in and post burn in test
•Safety measure by simultaneous Voltage / Current measurement and temperature monitoring
•Manual/Automate SiC bare wafer handling 6” 8”
•Designed to be efficient and effective in its performance while taking up minimal space
•Multiple test parallelism with precision thermal chuck up to 200 200°C
•Optical alignment before probe
•Probe mark inspection capability
•User definable burn in profile
•Support pre burn in and post burn in test
•Safety measure by simultaneous Voltage / Current measurement and temperature monitoring
•Manual/Automate SiC bare wafer handling 6” 8”
TROOPER-BI4
晶圓級功率器件老化測試分選機
Trooper-BI4是一款全自動老化測試分選機，為碳化硅晶圓可靠性和晶圓級老化測試提供了卓越的性能。它允許4片晶圓同時老化，用我們的精密主動對準龍門系統可以自動處理晶圓從晶圓盒到卡盤。改分選機可以支持2英寸至12英寸的晶圓，並提供多個探頭測試，每個晶圓可達到1800個測試通道，熱卡盤溫度可高達200∘C。
Trooper-BI4是一款全自動老化測試分選機，為碳化硅晶圓可靠性和晶圓級老化測試提供了卓越的性能。它允許4片晶圓同時老化，用我們的精密主動對準龍門系統可以自動處理晶圓從晶圓盒到卡盤。改分選機可以支持2英寸至12英寸的晶圓，並提供多個探頭測試，每個晶圓可達到1800個測試通道，熱卡盤溫度可高達200∘C。
- 通道數：每個晶圓單元多達1800個通道
- 處理2”，3”，4”，5”，6”，8”和12”裸晶圓片
- 使用熱卡盤在高達200∘C的高溫下進行多個探頭測試
- 用戶自定義老化配置文件
- 執行老化前和老化後的測試
- 老化後視覺檢查
- 在老化過程中實時電壓/電流測量和溫度監測
